【摘要】 深亚微米技术背景下,嵌入式存储器在片上系统芯片(system-on-a-chip,SoC)中占有越来越多的芯片面积,嵌入式存储器的测试正面临诸多新的挑战。本文论述了两种适合SoC芯片中嵌入式flash存储器的内建自测试设计方案。详细讨论了专用硬件方式内建自测试的设计及其实现,并且提出了一种新型的软硬协同方式的内建自测试设计。这种新型的测试方案目标在于结合专用硬件方式内建自测试方案并有效利用SoC芯片上现有的资源,以保证满足测试过程中的功耗限制,同时在测试时间和芯片面积占用及性能之间寻求平衡。最后对两种方案的优缺点进行了分析对比。更多还原

【Abstract】 Embedded memories consume an increasing portion of the die area in deep submicron system-on-a-chip (SoC). New challenges now confronted the test of embedded memories. In this paper we present two BIST approaches suitable for embedded flash memory testing in a SoC environment. The hardware-centric approaches for embedded memory is examined and a new built-in self-test(BIST)-based method called hardware/software co-testing is introduced. This novel approach aims to balance the usage of the existing on-chip resources and dedicated hardware-centric approach such that the functional power constraints are not exceeded during test while trading-off the testing time against DFT area and performance overhead. The advantages and disadvantages of these two methods are compared in the end.更多还原