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X射线掩模电子束制备图形过程中的数值研究
Numerical Simulation of the X-ray Mask during Electron-beam Patterning
【摘要】 得到移动光源照射下平板温度分布的理论解,验证了有限元方法的正确性。建立了X射线掩模电子束制备图形过程中传热的三维有限元模型,给出了掩模瞬态温度变化规律。结果表明,辐射是X射线掩模在图形制备中必须考虑的重要因素之一,当不考虑辐射时,掩模瞬时最高温度随时间振荡升高,最高温度为35.20℃;当考虑辐射时,掩模瞬时最高温度随时间周期变化,最高温度为26.95℃。
【Abstract】 Theory solution of plane temperature distribution was obtained under moving beam ex- posure and the finite element method was verified·Developing three-dimensional finite element model of X-ray mask during electron-beam patterning (EBP), transient temperature variation was given·The results show that radiation is one of the most important factors for X-ray mask during EBP·Taking no account of the radiation, the transient maximum temperature fluctuates and in-
【关键词】 掩模;
电子束书写;
温度分布;
图形制备;
有限元分析;
【Key words】 <Keyword>mask; electron-beam writing; temperature distribution; patterning; finite element analysis;
【Key words】 <Keyword>mask; electron-beam writing; temperature distribution; patterning; finite element analysis;
【基金】 国家自然科学基金资助项目(59976004)
- 【文献出处】 微细加工技术 ,Microfabrication Technology , 编辑部邮箱 ,2005年02期
- 【分类号】TN305
- 【被引频次】1
- 【下载频次】36