【摘要】 针对目前国内半导体激光器测量仪器系统庞大、操作复杂、测量周期长、价格昂贵、不易于推广的情况,研制了较低成本的半导体激光器特性参数测量装置.它能够方便、准确地测量激光器的重要参数,并能根据测得的电压—电流和功率—电流特性曲线对器件的质量和性能作出评价.更多还原

【Abstract】 According to the present status that testing system has the high testing precision, but it is very huge in size, difficult to operate, long term to test, and higher price, so it is difficult to use it widely. In the light the present condition, a new device is developed successfully with lower cost, which can measure the important parameter of LD precisely, and the idiocratic curve of LD can be got by processing the data got from our testing devive, such as voltage-current curve, optical power-current curve, and the performance of LD can also be evaluated.更多还原