【摘要】 针对现有测试描述语言TTCN3的不足,提出了在多端口并发测试条件下,测试语言应分为上、下两个层次,即宏观描述与微观描述两部分的观点.在此基础上定义了一种新的测试描述语言:并发多端口测试定义语言(Concurrent Multi-Port Test Definition Language-CMPT-DL),该语言可用于在多端口并发条件下对一致性测试、性能测试、互通性测试的描述.最后,利用该语言编写了一个测试用例.更多还原

【Abstract】 Based the inadequateness of TTCN3,this paper presents that test definition language should be divided into two layers,one for macroscopic description and the other for microscopic achievement under the condition of multi-port and concurrent test.Further more,a new test definition language-Concurrent Multi-Port Test Definition Language(CMPTDL) is defined in this paper.At last,two examples in which test cases are written with CMPTDL are given.更多还原