节点文献
时效Sn-9Zn-3Bi/Cu钎焊接头的电子探针分析
ELECTRON PROBE ANALYSIS OF Sn-9Zn-3Bi SOLDER/Cu JOINT AFTER AGING
【摘要】 用EPMA 1600型电子探针波谱分析了 Sn 9Zn 3Bi/Cu钎焊接头在 170℃时效 1 000h后的界面组织及其成分。结果表明,界面处存在三层化合物层。从基体铜侧起,依次为 Cu Sn化合物层、Cu Zn化合物层和Sn Cu化合物层。电子探针能够有效分析微观组织、成分的变化和扩散现象。
【Abstract】 The microstructure and composition of the Sn-9Zn-3Bi/Cu joint after 1000h aging were investigation using EPMA. The results indicated that there exits three intemetallic compound (IMC) layers at the solder joint. From Cu side they are Cu-Sn IMC layer, Cu-Zn IMC layer and Sn-Cu IMC layer respectively. The EPMA can analysis the microstructures、compositions as well as the diffusion phenomenon successfully.
【关键词】 无铅钎料;
Sn-Zn-Bi;
时效;
界面反应;
电子探针;
【Key words】 Lead-free solder; Sn-Zn-Bi; Aging; Interface reaction; EPMA;
【Key words】 Lead-free solder; Sn-Zn-Bi; Aging; Interface reaction; EPMA;
- 【文献出处】 理化检验(物理分册) ,Physical Testing and Chemical Analysis Part A Physical Testing , 编辑部邮箱 ,2005年03期
- 【分类号】TG407
- 【被引频次】1
- 【下载频次】187