【摘要】 利用1996—2003年期间 GOES 卫星耀斑观测资料和国际 GPS 观测网的 GPS-TEC 资料分析x 级大耀斑事件引起的电离层电子浓度总含量(TEC)的突然增强(SITEC)现象．对 x 射线耀斑等级、耀斑日面位置与 SITEC 的关系进行了分析．结果表明，两者都与 SITEC 现象的强弱有着一定的正相关性．在消除 X 射线耀斑等级、耀斑日面位置对电离层 SITEC 现象的影响后，进而分析了日地距离以及耀斑持续时间对电离层 SITEC 现象的影响．结果表明，日地距离和耀斑持续时间都是影响 SITEC 现象的重要参数，日地距离较近时发生的耀斑事件引起的 SITEC 现象较为强烈．另外，耀斑持续时间越长，SITEC 现象越微弱，但是当耀斑持续时间继续延长时，SITEC 现象的强弱逐渐趋于不再改变，最后在某值附近达到平衡．还对某些没有在电离层中引起明显 SITEC 现象的耀斑事件进行了讨论，发现了这类耀斑的一些特征．更多还原

【Abstract】 In this paper,the SITEC phenomena is investigated which were caused by the X-class X-ray solar flares occurred from 1996 to 2003.The TEC data which obtained from a global GPS networkare used to calculate the TEC increment,ΔTEC_f,and the variation rate increment,Δ(dTEC_f/dt),caused by solar flares.It is found that both ΔTEC_f and Δ(dTEC_f/dt)are closely related with theflare’s maximal X-ray flux and its location on the solar disc.After eliminating the effect of themaximal X-ray fluxes and the locations on solar disc of different flares,results showed that thereis a negative relationship between ΔTEC_f and the distance between the Earth and the Sun.Thelarger the distance,the smaller is the ΔTEC_f.Another finding is that △(dTEC_f/dt)correlates withthe duration of the flare.Some characteristics of the flares which cause no obvious SITEC are alsofound.更多还原