【摘要】 对孪晶铜进行塑性应变幅控制下的疲劳实验,研究了不同宽度的孪晶内疲劳位错组态及演化过程.结果表明,孪晶宽度不同时,孪晶内的疲劳位错组态不同.当孪晶宽度大于1μm时,孪晶内疲劳位错组态与单晶中情况类似;孪晶宽度介于1μm到200 nm之间时,位错形成类PSBs结构;孪晶宽度介于200 nm到20 nm之间时,孪晶内只能形成一些位错碎片;孪晶宽度小于20 nm时,孪晶内没有稳定的晶格位错存在.更多还原

【Abstract】 Symmetrical push-pull fatigue tests were conducted on as-electrodeposited polycrys-talline twin copper. Different dislocation configurations were formed in twins with different widths. When the twin width Wt >1μm, loop patches and walls were found in twins, the same as that in single crystal; when 1 μm> Wt >200 nm, ladder-like structures formed in twin, which like persistent slip bands (PSBs); when 200 nm> Wt >20 nm, only some dislocation fragments were found; when Wt <20 nm, no stable crystal dislocation segments exist in the twin.更多还原