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用掺杂方法改变VO2多晶薄膜相变温度研究

Change of Phase Transition Temperature of Polycrystalline Vanadium Dioxide Film by Doping Methods

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【作者】 谢建生李金华袁宁一陈汉松周懿

【Author】 XIE Jian-sheng,Li Jin-hua,YUAN Ning-yi,CHEN Han-song,ZHOU Yi (Functional Materials Laboratory,Jiangsu Polytechnic University,Changzhou 213016,China)

【机构】 江苏工业学院功能材料实验室江苏工业学院功能材料实验室 江苏常州213016江苏常州213016江苏常州213016

【摘要】 用离子束增强沉积方法对二氧化钒多晶薄膜作Ar和W掺杂,明显改变了二氧化钒薄膜的相变温度。研究表明,成膜时注入的氩在二氧化钒结构形成前就很快外释,掺杂Ar对相变温度降低的贡献主要来自间隙Ar。W原子的掺杂可有效地将二氧化钒多晶薄膜的相变温度降低到室温附近,为大幅提高薄膜的室温电阻-温度系数提供了可能。

【Abstract】 Polycrystalline VO2 films doped with argon and tungsten were prepared by modified Ion Beam Enhanced Deposition(IBED) method.The experiment results indicated that the phase transition temperature(Tc) of the doped IBED VO2 films were decreased evidently compared to un-doping VO2 films.The most of implanted Ar atoms in the as-IBED films will diffuse out before crystallization.The remaining Ar will appear at the interstitial site of the VO2 lattice and the boundary of the grain.The effect of argon doping on the phase transition temperature was mainly contributed by the Ar at the interstitial site.Tungsten doping could decrease effectively the Tc of the vanadium dioxide film to room temperature.It is possible to increase the temperature coefficient of resistance of the films for IR application.

【基金】 国家自然科学基金(60277019);江苏省自然科学基金(BK2005023)
  • 【文献出处】 江苏工业学院学报 ,Journal of Jiangsu Polytechnic University , 编辑部邮箱 ,2005年03期
  • 【分类号】O484;
  • 【被引频次】15
  • 【下载频次】275
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