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电容层析成像系统中未知介电常数时测量数据的归一化处理

Normalization Approach for Capacitance Tomography Measurement Date for Unknown Permittivity Tomography Target

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【作者】 丁振君王化祥宋占表李维平王秀凤

【Author】 DING Zhen-jun~1,WANG Hua-xiang~1,SONG Zhan-biao~2,LI Wei-ping~3,WANG Xiu-feng~4 (1.College of Automates,Tianjin University,Tianjin 300072,China;2.Supervision Institution of Quality and Technology,Hebei University,Baoding 071002,China;3.Department of Electric Appliances,School of Electron Machinery,Jinan 250101,China;4.Professional Department,Schlool of Technician,Liaoyang 111000,China)

【机构】 天津大学自动化学院河北大学质监学院济南电子工程学校电器部辽宁省辽阳市技工学校专业部 天津300072天津300072河北保定071002山东济南250101辽宁辽阳111000

【摘要】 电容层析成像系统重建图像前要对电容测量值进行归一化处理.对于已知介电常数的成像对象,电容测量值采用0-1校验法进行归一化处理;对于未知介电常数的成像对象,电容测量值采用仿真校验法进行归一化处理,仿真结果表明,可获得很好的重建图像质量.

【Abstract】 The measured capacitances of electrical capacitance tomography system are usually normalized before used for image reconstruction.For knowing permittivity tomography target,the measured capacitances are normalized by 0-1 test.For unknown permittivity tomography target,the measured capacitances are normalized by simulated test.Simulation results show that the quality of reconstructed image satisfactory.

  • 【文献出处】 河北大学学报(自然科学版) ,Journal of Hebei University(Natural Science Edition) , 编辑部邮箱 ,2005年05期
  • 【分类号】TP274.4;
  • 【被引频次】10
  • 【下载频次】262
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