节点文献

单光束Z扫描法测量Nd∶YVO₄的非线性折射率

Measurement of the Nonlinear Refraction Index of Nd∶YVO₄ Crystal by Single-beam Z Scan

推荐 CAJ下载
PDF下载
不支持迅雷等下载工具，请取消加速工具后下载。

【Author】 Guan Jun 1,3,Li Xia2,Cheng Guanghua 1,3,Chen Guofu1,Hou Xun 1,2 1 State Key Laboratory of Transient Optics Technology, Xi′an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi′an 710068 2 College of Physics and Information Optic-electronics, Henan University, Kaifeng 475001 3 Graduate School of the Chinese Academy of Sciences, Beijing 100039

【机构】中国科学院西安光学精密机械研究所瞬态光学技术国家重点实验室；河南大学物理与信息光电子学院；中国科学院西安光学精密机械研究所瞬态光学技术国家重点实验室西安710068中国科学院研究生院；北京100039；开封475001；西安710068中国科学院研究生院；西安710068；西安710068河南大学物理与信息光电子学院；开封475001；

【摘要】采用单光束Z扫描方法,对4mm厚Nd∶YVO4晶体的非线性折射率进行了测量。采用薄样品理论对测量数据进行计算处理,所得出的结果与其他不同方法测得的结果相吻合.由此证明这种简单的测量和处理方法的合理性和有效性.更多还原

【Abstract】 In this measurement of the nonlinear refraction index of 4mm thick Nd∶YVO₄ crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.更多还原