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铁电SBN薄膜电光系数的测量及其在波导中的应用

Measurement of Electrooptic Coefficients in SBN60 Thin Films and Their Applications in Mach-Zehnder Type Waveguide Modulators

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【作者】 沈智如叶辉沈伟东曹晓燕郭冰

【Author】 Shen Zhiru Ye Hui Shen Weidong Cao Xiaoyan Guo Bing (State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027)

【机构】 浙江大学现代光学仪器国家重点实验室浙江大学现代光学仪器国家重点实验室 杭州310027杭州310027杭州310027

【摘要】 利用溶胶凝胶法在MgO(001)衬底上获得C轴择优取向的铁电铌酸锶钡(SBN)薄膜,主要介绍MgO(001)衬底上SBN60薄膜及掺入的K离子与Nb离子摩尔比例为1∶3的SBN60薄膜横向电光系数r51的测量,实验测得不掺K的SBN60薄膜r51值为37.6 pm/V,掺K的r51值为58.5 pm/V。并由此设计一种基于MgO(001)衬底上的马赫曾德尔型SBN60薄膜波导调制器,计算出在633 nm时,掺K比例为1∶3的此种波导调制器半波调制电压值为10 V,不掺K的半波电压值为16 V,结果说明掺入K离子能增加薄膜的横向电光系数并有效的减少波导的半波调制电压。

【Abstract】 High-qualityc- axis oriented SBN60 thin films on MgO(001) substrates have been obtained by the sol-gel process, the transverse electrooptic coefficients r 51of the SBN60 without K-doped and K-doped (with the K+/Nb 5+molar ratio of 1/3) SBN60 thin films were measured as 37.6 pm/V and 58.5 pm/V respectively. The transverse coefficient of the SBN60 films was shown to increase with the K ions doping. Mach-Zehnder type waveguide modulators made of SBN60 thin films were designed. Electrooptic modulation has been demonstrated with the half-wave modulation voltage V π=16 V for SBN60 and that of V π= 10 Vfor the K-doped SBN60 at 633 nm wavelength. The half-wave modulation voltage was demonstrated to be decreased with the K ion doping.

【基金】 国家自然科学基金(60008005);浙江省自然科学基金(500077)资助课题
  • 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,2005年01期
  • 【分类号】TB383
  • 【被引频次】3
  • 【下载频次】168
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