【摘要】 选用YG30硬质合金与45钢进行电子束对接焊复合试验,用扫描电镜、波长分散X射线谱仪对焊接接头显微组织进行了分析。结果表明:当电子束电流小、焊接速度慢时,焊接接头易形成有害的η相,η相分布于YG30/焊缝界面区域,并聚集长大,η相层厚度约10μm;焊接过程中硬质合金脱碳和铁向硬质合金迁移是η相形成的主要原因。更多还原

【Abstract】 The electron beam welding of cemented carbide YG30 and carbon steel 45 was carried out. The scanning electron microscope (SEM) equipped with wavelength-dispersive X-ray spectrometer was used to analyze the microstructure of weld joints. The results showed that detrimental eta phases were formed easily when the beam current was small and the welding speed was low. The eta phases appeared, accumulated, and gew at the zones near the boundaries of YG30 and welding. The thickness of eta phase layer was about 10 micrometers. The main reason of eta phase formation was that the carbon and iron diffused from the cemented carbide and the weld respectively during welding.更多还原