【摘要】 采用流延工艺制备了半晶态的PVDF薄膜,通过X射线衍射分析(XRD)对不同电场强度下电极化的薄膜进行了表征。电极化的相变过程为α相→δ相→β相。薄膜的铁电性能分析表明,薄膜的剩余极化值Pr随电场强度变化的趋势符合Boltzmann分布函数,拟合的Boltzmann方程表明:引起Pr变化最大的极化电场强度范围是105~125MV/m,最大的剩余极化值Pr达到6μC/cm2。更多还原

【Abstract】 The semi-crystalline poly(vinylidene fluoride) thin films were prepared by using casting method.The thin films were characterized by X-ray diffraction(XRD) and atomic force microscopy(AFM).The results showed that the phase transition of PVDF thin films is α → δ→ β phase during electric poling.According to ferroelectric hysteresis loops performance of the thin films,it could be found that the trend of remnant polarization Pr increased with electric field intensity was coincident with Boltzmann distributing function.And the Boltzmann equation indicated that the confines of electric field intensity brought the maximal remnant polarization Pr was 105～125MV/m,the maximal remnant polarization Pr could attain 6μC/cm2.更多还原