【摘要】 利用SEM电镜测试和X射线衍射测试验证了纳米SiO2和纳米LS在RTVSR中的分散性;借助FT IR红 外光谱和光学聚焦法测试研究了RTVSR/SiO2和RTVSR/LS两种纳米复合材料的憎水性及憎水迁移性;同时测试分析了两种纳米复合材料的tanδ、ρ和耐漏电起痕等基本电气性能指标。试验证明RTVSR在改性后仍具有好的憎水性和憎水迁移性,且其电气性能指标仍符合要求。更多还原

【Abstract】 The dispersivity of nano SiO 2 and nano LS in RTVSR is examined by SEM and XRD. The hydrophobicity and migration of hydrophob ia of the RTV nano-composite SR/SiO 2 and SR/LS are studied by FT-IR and OPF. At the same time, the basic electrical properties are tested and analyzed, such as trace of leakage current, tan δ, ρ and hydrophobia contact angle. The tests prove that RTV nano-composite SR/SiO 2 and SR/LS is better in migration of hydrophobia and hydrophobicity, and their electrical properties are still at level to meet requirement.更多还原