【摘要】 提出了一种测量晶体压电系数和电光系数的新方法。晶体厚度和折射率的变化导致衰减全反射(ATR)谱的同步角发生移动,进而引起反射率的变化。选择两个不同阶导模的工作角,施加电压分别测出反射光强的变化,可得到压电系数和电光系数。反射率相对于厚度和折射率的灵敏度分别可达到108m-1和103。该方法可同时测量压电系数和电光系数,测量灵敏度高,样品结构简单,实验装置简便,所需的测量电压低。更多还原

【Abstract】 A new method for measuring piezoelectric coefficient and electro-optical coefficients of crystal is proposed. The variations of crystal thickness and refractive index will lead to a shift of synchronous angle of Attenuated Total Reflection (ATR) spectrum, and then bring reflectance variation. By selecting an operating angle with two different modes, applying proper voltage and measuring the variations of reflective light, the piezoelectric coefficients and electro-optical coefficients can be obtained. The sensitivity of reflectance vs. thickness and refractive index are 108m-1 and 103, respectively. Both piezoelectric coefficient and electro-optical coefficient can be synchronously measured by this method. The measuring setup has the advantages of high sensitivity, simple structure and low measuring voltage.更多还原