节点文献
R_s测试标准的探讨
MEASUREMENT STANDARD OF MICROWAVE SURFACE RESISTANCE OF SUPERCONDUCTIVE THIN FILMS
【摘要】 本文在目前国际上正在制订的高温超导薄膜微波表面电阻Rs 标准测量方案的基础上,介绍了国内正在研制的测试方法和系统.该系统采用低损耗高介电常数的兰宝石构成工作在TE0 1 1 +δ谐振模式的介质谐振器,在原有研究基础上利用电磁场仿真,改变了输入和输出耦合方式,在77K时,利用它对单片高温超导薄膜Rs进行测试,提高了整个测试系统的品质因素,可成功地用于10×10mm2 ,10×15mm2 和Φ5 1mm等多种规格样片的测试.整个测试系统体积小,操作方便,且所需实验条件简单,测试灵敏度高,重复性好,对高温超导薄膜无损伤.
【Abstract】 The international measurement standard of microwave surface resistance R-s of high T-c superconductive thin films is introduced first. By imitating the distributy of the electromagnetic field and changing the coupled method, the surface resistance of a single piece of super-conductive thin film can be measured by a sapphire resonator with TE-{011+ δ } mode non-destructivity, at 77K. The films′ specifications can be 10×10mm+2, 10×15mm+2 and Φ51mm etc. The method has advantages of non-destructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation.
【Key words】 high T_c super-conductive film; microwave surface resistance; sapphire resonator; quality factor;
- 【文献出处】 低温物理学报 ,Chinese Journal of Low Temperature Physics , 编辑部邮箱 ,2005年02期
- 【分类号】TM934
- 【下载频次】52