节点文献
基于多CIS的PCB基板缺陷自动光学检测系统
Automatic Optical Inspection of PCB Base Board’s Defect Based on Multi-CIS
【摘要】 提出一种利用多CIS实现的检测PCB基板缺陷的新方法。采用多条CIS并行工作,并利用EZ-USBFX2作为USB接口控制器,高速地将CIS采集的图像数据向主机传送,应用程序再将得到的PCB图像数据进行处理,从而检测出PCB基板的缺陷。
【Abstract】 In this paper, a new method for detecting defect of PCB base board is proposed. Several CISs concurrent processing at the mean time, the image data was transmitted to the host with USB which use the EZ-USB FX2 as USB controller. The application process the board image to get the result. The principle and the Realization of the system are given.
- 【文献出处】 电子工业专用设备 ,Equipment For Electronic Products Manufacturing , 编辑部邮箱 ,2005年07期
- 【分类号】TN407
- 【被引频次】14
- 【下载频次】171