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复合镀层中纳米SiO2含量的测定方法研究
Research on determining methods of nano-scale SiO2 particle content in composite coatings
【摘要】 纳米复合镀层中纳米粉体含量的测定目前主要采用重量法和表面能谱分析法,而这2种方法都存在较大的局限性。提出采用紫外-可见分光光度法测定复合镀层中纳米SiO2的含量。以pH=1的HNO3溶液、NiSO4 HNO3溶液、CuSO4 HNO3溶液、ZnSO4 HNO3分别作为空白液来模拟复合镀层的溶解液。通过试验确定了测定波长,试验发现测定的标准曲线线性都非常理想。采用该法与重量分析法分别测定了待测液中纳米SiO2的含量,并对其误差进行了比较,结果表明该法的准确度高,其平均相对误差(1 05%)远远小于重量分析法,而且更省时。
【Abstract】 The main methods of determining nano-scale SiO2 particle content in composite coatings at present are gravimetric analysis and surface energy spectrum analysis, while both of them have many limitations. Ultraviolet-visible spectrophotometry was proposed to measure the nano-scale SiO2 particle content in composite coatings. HNO3 solution, NiSO4-HNO3 solution, CuSO4-HNO3 solution and ZnSO4-HNO3 solution were respectively used as blank solution and for simulating the dissolving solution of composite coatings. The wavelength was determined by test. The results prove that the standard curves are very satisfactory. This method and gravimetric analysis were respectively applicable to determine the nano-scale SiO2 particle content in the solutions to be tested. The results show that ultraviolet-visible spectrophotometry has high accuracy and far lower average relative error (1.05%) than gravimetric analysis method, and is more time-saving.
【Key words】 ultraviolet-visible spectrophotometry; composite plating; nano-scale SiO2 particle;
- 【文献出处】 电镀与涂饰 ,Electroplating & Finishing , 编辑部邮箱 ,2005年04期
- 【分类号】TQ153.12
- 【被引频次】5
- 【下载频次】195