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UC表层的X射线光电子能谱研究
Characterization of Uranium Monocarbide Surfaces by XPS
【摘要】 采用X 射线光电子能谱(XPS)分析研究了烧结UC(包括钚的碳化物)样品的表面层结构。分析结果表明,经大气氧化的UC 表层由表及里大致组成为:少量UO2+ →UO2与UC 的混合物及少量自由碳→UC 基体。UC 的U4f7/2 x峰和C1s 峰结合能分别为378.2 eV 和282 eV。定量分析表明,UC 清洁表面的C/U 原子比约为1?1,这与UC 的化学组成一致,但此时仍能探测到少量固溶氧存在。初步探讨了UC 在大气环境中的氧化机理。
【Abstract】 The air-exposed surfaces of sintered UC samples at room temperature were examined by X-ray photoelectron spectroscopy (XPS). Elemental depth profiles reveal that the surface of UC consists of a top layer of small amounts of UO2+ ; this very thin layer is x followed by a layer containing uranium dioxide, uranium monocarbide and free carbon and then bulk UC. The binding energy of U4f7/2 and C1s peaks of UC is found to be 378.2 eV and 282 eV, respectively. Quantitative analysis indicates that the C/U atomic ratio of clean UC surfaces is approximately 1?1, which is consistent with stoichiometric UC, but there exists small amounts of dissolved oxygen on sputter-cleaned UC surfaces. The oxidation mechanism of UC has been also discussed.
- 【文献出处】 稀有金属材料与工程 ,Rare Metal Materials and Engineering , 编辑部邮箱 ,2005年03期
- 【分类号】O614.6
- 【被引频次】3
- 【下载频次】111