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Y2O3掺杂对低压氧化锌压敏电阻材料结构和电学性能的影响

Effect on the Electrical Properties and Microstructure of Low Voltage ZnO Varistors Doped with Y2O3

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【作者】 王茂华胡克鳌赵斌元张南法

【Author】 WANG Mao-hua~1,HU Ke-ao~1,ZHAO Bin-yuan~1,ZHANG Nan-fa~2(1.State Key Lab Of MMCs,Shanghai Jiaotong University,Shanghai 200030;2.Changzhou Chuangjie Lightning Protection Co.Ltd.,Changzhou 213016,China)

【机构】 上海交通大学金属基复合材料国家重点实验室常州市创捷防雷电子有限公司 上海200030上海200030江苏常州213016

【摘要】 通过掺杂研究了微量Y2O3对低压氧化锌压敏电阻的电性能影响,并采用SEM测试手段对其微观组织结构进行了分析研究,从理论上探讨了Y2O3影响低压氧化锌压敏电阻电性能与组织的机理。研究结果表明,在0~0.07%(摩尔分数)掺杂范围内,随着Y2O3含量的增加,低压氧化锌压敏电阻的电场强度明显提高;当Y2O3含量超过0.07%时,电场强度又呈下降趋势。低压氧化锌压敏电阻掺杂Y2O3后,非线性指数α增大,漏电流IL减小,但当掺杂量在0.06%~0.09%(摩尔分数)的范围内,漏电流IL和非线性指数α的变化不大。其原因是Y2O3加入到氧化锌压敏电阻中,Y主要以固溶的形态分布于ZnO晶内和晶界处,使ZnO晶体的自由电子浓度增大,进而使填隙锌离子Zni的总浓度下降,引起填隙锌离子的传质能力下降,抑制了ZnO晶粒的生长,因而晶粒尺寸随Y2O3掺杂量的增加而减小。

【Abstract】 The effect of Y2O3 on electrical properties and microstructure of low voltage ZnO varistors was studied.The mechanism of the effect of Y2O3 was suggested based on theoretical analysis by using SEM.The results show that electrical field of low voltage ZnO varistors increased with the content of Y2O3 in the range of 0~0.07%(mole fraction).But when the content of Y2O3 was more than 0.07mol%,the electrical field decreased with increasing Y2O3 content.The nonlinear coefficient(α) increased and the leakage current(IL)decreased with increasing Y2O3 content,but when the content of Y2O3 was in the range of 0~0.06%,the variation of nonlinear coefficient(α) and the leakage current(IL) was very small.The microstructure analysis indicates that the additive of Y2O3 lies inside ZnO grain and on the boundary,which leads to the decrease of the concentration of interstitial zinc,and then the size of ZnO grain decreases with the addition of Y2O3.

  • 【文献出处】 材料科学与工程学报 ,Journal of Materials Science and Engineering , 编辑部邮箱 ,2005年06期
  • 【分类号】TM22;
  • 【被引频次】9
  • 【下载频次】337
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