【摘要】 从理论上分析了像素响应不均匀性对CCD亚像素细分的影响 ,以及CCD暗电流和光电响应不均匀性产生的原因。根据光电响应模型提出了CCD像素光电响应不均匀性的校正方法 ,推导出了像素光电响应不均匀性的校正系数的计算方法 ,并给出了校正性能评价方法。针对实际校正中干扰光的影响 ,提出了采用变波长去除干扰方法 ,用以对校正方法进一步修正和加强校正的稳定性。研究表明 ,能量和噪声的变化对提出的校正方法影响小 ,校正过程不受信号分布形式的影响 ,校正量对信号能量变化具有自适应性。仿真和实验结果验证了校正方法和校正系数算法的正确性和可行性 ,表明校正方法可以有效地提高亚像素细分的准确性和稳定性。更多还原

【Abstract】 The influence of non-uniformity for sub-pixel determination, the cause for CCD dark current and photoelectric response are theoretically analyzed. A correction method based on the model of photoelectric signal is proposed for correction of CCD photoelectric response non-uniformity. A coefficient is derived for calculation of electronic quantity to be corrected, and an appraised method of correction capability is given as well. The interference lights are eliminated by the wavelength varying in order to revise and improve stability of the correction method. The research indicates that the energy, noise and signal distribution have less influence to the correction method. Correction value is acclimatized to the signal. The experimental and emulational results prove the validity and feasibility of the approaches in theory and application. It also proves the accuracy and satiability of the sub-pixel determination.更多还原