节点文献
新型SON器件的自加热效应
Self-Heating Effect in Novel SON Device
【摘要】 分析了自加热效应对SON器件性能的影响,并与SOI器件进行了比较.提出构造散热通路的方法来抑制SON器件的自加热效应,分析了不同通路情况对自加热效应的抑制程度.还对散热性能较好的具有不连续空洞埋层的SON器件进行了研究,并分析了空洞大小和横向位置偏差对器件性能的影响,为器件结构设计提供了指导.
【Abstract】 The effect of self-heating in novel SON devices,compared with that in SOI devices,is comprehensively investigated.By making thermal dissipating paths through the void layer,the self-heating effect is effectively alleviated.In addition,the influence of the width of the paths is studied.The characteristics of the SON structure with a discrete void layer,which effectively suppresses the self-heating effect,are analyzed.The influence of the size and position of the discrete voids on device performance is analyzed,which gives guidelines for the device structure design.
【Key words】 silicon-on-nothing device; self-heating effect; thermal dissipating path; void layer;
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2005年07期
- 【分类号】TN432
- 【被引频次】2
- 【下载频次】186