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Sn-9Zn-3Bi/Cu钎焊接头在170℃时效过程中的显微结构
Microstructures of Sn-9Zn-3Bi solder/Cu joint during long-term aging at 170 ℃
【摘要】 采用ST50润湿实验仪完成了钎焊并研究分析了Sn 9Zn 3Bi/Cu接头在170℃下长期时效的显微结构变化。结果表明:Sn 9Zn 3Bi/Cn接头时效至200h后在界面处形成单一连续的Cu5Zn8化合物层;时效至500h和1000h后,界面处形成了3层化合物层,从铜母材侧起,分别为Cu Sn化合物层,Cu Zn化合物层和Sn Cu化合物层;随着时效时间的增加,整个金属化合物层变厚,而Cu Zn化合物层减薄,表明Cu Zn化合物层在时效过程中具有不稳定性。
【Abstract】 Soldering process was performed by wetting test machine ST50. The microstructures of Sn-9Zn-3Bi/Cu joint were investigated under 170 ℃ thermal exposure conditions. The results show that a continuous single layer of Cu5Zn8 intermetallic compound appears when aging within 200 h and three layers are formed after aging for 500 h and 1 000 h. From the Cu substrate, they are Cu-Sn layer, Cu-Zn layer, Sn-Cu layer, respectively. The total intermetallic compound layers thicken while the thickness of Cu-Zn compound layer decreases with increasing exposure time. It indicates that the Cu-Zn compounds are not stable during long-term aging.
【Key words】 lead-free solder; Sn-Zn-Bi; microstructure; interface reaction; intermetallic compound;
- 【文献出处】 中国有色金属学报 ,The Chinese Journal of Nonferrous Metals , 编辑部邮箱 ,2004年05期
- 【分类号】TG407
- 【被引频次】24
- 【下载频次】254