【摘要】 在已有的负电子亲和势 (NEA)光电阴极特性评估技术的基础上 ,研制了三代微光器件的测试和评估系统工程样机 ,用于对三代微光器件的光谱响应等参数的测试和激活过程中的工艺信息监控 ,通过分析计算可获得三代微光器件光电阴极的表面逸出几率、载流子扩散长度和后界面复合速率等参数。利用该系统对三代微光像增强器进行了测试和评估 ,文中给出了测试结果并加以分析。更多还原

【Abstract】 A novel prototype instrument has been successfully developed to measure and evaluate the third generation(G-Ⅲ)low light level(LLL)imaging devices,by modifying the conventional evaluation technique of the negative electron affinity of photo-cathodes.Key parameters of G-Ⅲ LLL devices,including its spectral response and various physical quantities during excitation,can be directly measured.More physical quantities,such as the surface electron escape probability,carrier diffusion length and its back-interface recombination velocity,can also be deduced by physical analyses and numerical simulation,Some G-Ⅲ LLL image intensifiers were measured and evaluated too.更多还原