【摘要】 介绍了以AD公司推出的高速浮点DSP-TS101为设计平台的存储器测试用图形发生器的原理和实现方法,详细地分析、研究了高速测试存储器的软件、硬件.本测试系统突破了传统测试方法的限制,具有结构紧凑、编程灵活的特点,其测试速度超过了国内存储器测试用图形发生器40MHz的最高速度.更多还原

【Abstract】 This paper gives the theory and the designed method of pattern generators for memory test based on the high speed float-point digital signal processor TS101. The research in this paper mainly focuses on the software and the hardware of the high speed memory test system. This system breaks through the restriction of the traditional test method. It is compact in structure, flexible in programme mode and exceeds the max 40 MHz test speed of memory test systems in our country.更多还原