【摘要】 提出了一种改进的测试环单元设计.它在传统的P1500测试环单元基础上添加一个多路器,实现了对测试环单元的功能数据路径测试,并解决了测试环扫描链在扫描移位过程中的安全移位问题,同时还可以降低扫描移位过程中产生的动态测试功耗;在分析了两种典型测试环P1500测试环以及飞利浦TestShell测试环的基础上,提出了一种三态测试环结构.该结构允许共用同一条测试总线的不同IP核直接连接到测试总线上.更多还原

【Abstract】 An improved wrapper cell was presented based on analysis of two kinds of wrapper cells. It adds a mux to the traditional P1500 wrapper cell, which can test the data path of wrapper cells and also resolve the problem of safe shifting of scan chains during shifting;and reduces the dynamic test power during scan shifting. A kind of wrapper, namely tri-state wrapper, was put forward based on analysis of two kinds of wrappers: IEEE P1500 wrapper and TestShell from Philip. The architecture allows different cores to be connected directly to the same test bus.更多还原