【摘要】 提出了一种针对片上模数转换器进行内建自测试的方法.利用斜坡信号作为测试激励,测试电路可以通过对转换器的低位进行测试来获取增益误差、失调误差以及微分非线性和积分非线性误差.该方法测试结构简单,并具有较高的测试速度.更多还原

【Abstract】 In this paper, a new built-in self-test approach has been applied to testing on-chip AD converters. A ramp signal is used as test stimulation. This test circuit is capable of measuring the offset, gain, integral nonlinearity(INL), and differential nonlinearity(DNL) errors by testing the low bits of ADC. Simple structure, and high speed are the advantages of the proposed test structure.更多还原