【摘要】 提出了对同一时钟域中寄存器的测试操作进行划分的方法来降低测试峰值功耗,并且这种划分不需要重新生成测试向量,支持划分前生成测试向量的复用.实验表明,在稍微增加测试时间的条件下,所提出的测试方法能同时降低电路的峰值功耗、平均功耗和能耗.更多还原

【Abstract】 In this paper, we propose a new method to solve the peak power problem by partitioning the operation of flip-flops in the same clock domain during the scan test. This method need not regenerate test patterns so that the test patterns generated before partition can be reused. The experiments show that the proposed method can reduce the consumption of peak power, ave-rage power and energy simultaneously with a slight increase of test time.更多还原