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钙铝硅系微晶玻璃残余应力的初探

Analyse on Residual Stresses in CaO-Al₂O₃-SiO₂ System Glass-ceramics

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【Author】 XIE Jun 1,LIU Feng-juan 1,CHENG Jin-shu 1,HE Feng 1,YANG Shu-zhen 2 (1.Key Lab of Silicate Materials Science and Engineering of Ministry of Education, Wuhan University of Technology, Wuhan 430070, China; 2.The Centre for Materials Reseach and Analysis, Wuhan University of Technology, Wuhan 430070,China)

【机构】武汉理工大学硅酸盐材料工程教育部重点实验室；武汉理工大学测试中心武汉430070；武汉430070；武汉430070；

【摘要】介绍了 X射线衍射法测试应力的原理 ,并用 X射线衍射法测定了 Ca O- Al2 O3- Si O2 系微晶玻璃的残余应力 ,结合应力测试结果探讨了 Ca O- Al2 O3- Si O2 系微晶玻璃残余应力的形成原理。 X射线衍射法测试残余应力结果表明 ,试样表面的残余应力为压应力 ,并且当试样表面经过机械磨抛后 ,压应力值变小更多还原

【Abstract】 X-ray diffraction method to determine the residual stress was studied in this paper. Firstly, the use of X-ray diffraction method, the residual stress in CaO-Al₂O₃-SiO₂ system glass-ceramics had been measured. Secondly, it analysed the formation mechanism and characterization of residual stresses in CaO-Al₂O₃-SiO₂ system glass-ceramics. Lastly, the measured and calculated results indicated that the average residual stresses in glass-ceramic were compressed and after grinding the face of the sample, the average residual stresses decreased.更多还原