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Nd:LuVO4晶体的生长及其性能研究
Growth and Some Properties of Nd:LuVO4 Crystal
【摘要】 采用提拉 (Czochralski)法生长了Nd :LuVO4晶体。利用液相反应法 ,以V2 O5和NH4OH生成NH4VO3 ,Nd2 O3 、Lu2 O3 和HNO3 生成Nd(NO3 ) 3 和Lu(NO3 ) 3 反应制备多晶料 ;所生长Nd0 .0 1Lu0 .99VO4晶体为 16× 2 0× 2 1mm3 ,质量超过 4 0g。以X射线荧光分析仪测得其生长中各主要元素的分凝系数。其中Nd3 + 约为 0 .91,V3 + 和Lu3 + 接近 1。还测定了其介电常数ε11=2 7.2 ,ε3 3 =33.9(30℃ ,1kHz) ,以同步辐射X射线白光形貌术观察了其内部质量
【Abstract】 Nd:LuVO4 single crystal was grown by Czochralski method. Polycrystalline Nd:LuVO4 starting material was prepared by the solution reactions of NH4VO3 with either Nd(NO3)3 or Lu(NO3)3, which were obtained from respective oxide reacted with NH4OH or HNO3. The as-grown Nd0.01Lu0.99VO4 single crystal sized 16×20×21 mm3 weighted more than 40g. The effective segregation coefficients were measured to be (0.91) for Nd3+ and near 1 for V3+ and Lu3+ during crystal growth by means of X-ray fluorescence. The dielectric constants ε33 and ε11 were determined to be 27.2 and 33.9 (30℃,1kHz) respectively. The crystal quality was observed with synchrotron white beam X-ray topography.
【Key words】 Nd:LuVO4 crystal; Czochralski method; segregation coefficient; dielectric constant; synchrotron topography;
- 【文献出处】 人工晶体学报 ,Journal of Synthetic Crystals , 编辑部邮箱 ,2004年03期
- 【分类号】O782
- 【被引频次】16
- 【下载频次】145