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遗传算法的板级边界扫描测试矢量优化及应用
Optimization and Application of PCB Test Set by GA Based on Boundary-Scab Technology
【摘要】 测试矢量是边界扫描技术的关键之一,测试矢量集直接影响测试的效率和结果。文章将遗传算法引入可测性设计中的边界扫描测试领域,以PCB、MCM等为工程对象,探索了遗传算法的互连测试矢量生成,提出了具有互连测试特性的适应度函数、遗传算子和遗传操作,并进行了仿真实验和实际的DEMO板测试,结果表明该算法具有一定的优越性。
【Abstract】 Test generation is one key technologies of boundary scan.Test set affects test efficiency and results directly.Genetic Algorithm(GA)is inducted to boundary scan test in field of DFT(Design For Testability)in this paper.PCB(Printed Circuit Board)and MCM(Multi-chip Module)are taken as project objects to explore a novel algorithm of GA interconnect test generation.Based on the characteristic of interconnect,the fitness function and genetic operators are put forward.Through the imitation and test in practice for DEMO board developed by ourselves,that shows the algorithm is superior to other algorithms to some extent.
- 【文献出处】 计算机工程与应用 ,Computer Engineering and Applications , 编辑部邮箱 ,2004年20期
- 【分类号】TP18
- 【被引频次】7
- 【下载频次】136