节点文献

Femtosecond laser induced defects in various silica glasses

推荐 CAJ下载
PDF下载
不支持迅雷等下载工具，请取消加速工具后下载。

【Author】 Qinling Zhou Liying Liu Lei Xu ,Wencheng Wang Jianrong Qiu,Congshan Zhu and Fuxi Gan 1 Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800 2 State Key Lab for Advanced Photonic Materials and Devices,Department of Optical Science and Engineering, Fudan University,Shanghai 200433 3 Photon Craft Project,Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

【机构】 Shanghai Institute of Optics and Fine Mechanics； Chinese Academy of Sciences； Shanghai 201800 State Key Lab for Advanced Photonic Materials and Devices； Department of Optical Science and Engineering； Fudan University； Shanghai 200433； State Key Lab for Advanced Photonic Materials and Devices； Department of Optical Science and Engineering； Shanghai 200433； Photon Craft Project； Chinese Academy of Sciences； Shanghai 201800； Shanghai 201800； Shanghai 200433；

【摘要】 <正> The mechanism of near infrared (IR) focused femtosecond (fs) laser induced defects in silica glasses produced by different methods is systematically investigated through measurements of absorption, fluorescence, and electronic spin resonance (ESR) spectra. The influence of impurities and hydroxyl groups on defects is discussed. The results show that ES silica glasses containing high OH and few defects are much stable under fs laser irradiation. It is also verified that Si E_δ~′center formation has no direct relation with chloride ions.更多还原

【Abstract】 The mechanism of near infrared (IR) focused femtosecond (fs) laser induced defects in silica glasses produced by different methods is systematically investigated through measurements of absorption, fluorescence, and electronic spin resonance (ESR) spectra. The influence of impurities and hydroxyl groups on defects is discussed. The results show that ES silica glasses containing high OH and few defects are much stable under fs laser irradiation. It is also verified that Si E_δ~′center formation has no direct relation with chloride ions.更多还原

【关键词】 glasses； silica； defects； irradiation； systematically； divalent； hydroxyl； verified； monitored； bands；

【基金】 This work was supported by the National Natural Science Foundation of China (No. 10074011);the Ministry of Science and Technology of China (No. 2001CCA04600).

【文献出处】 Chinese Optics Letters ,中国光学快报(英文版) , 编辑部邮箱 ,2004年04期

【分类号】O434
【下载频次】39

知网节下载

节点文献中：

本文链接的文献网络图示:

本文的引文网络

节点文献