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MOCVD AlGaAs/GaAs HBT材料生长中基区、发射区结偏位的分析与控制
Analysis and Control of Deviation of Base-emitter P-N Junction Relative to Heterojunction in LP-MOVPE Growth of AlGaAs/GaAs HBT Material
【摘要】 分析了MOCVDAlGaAs/GaAsHBT外延材料生长中基区、发射区异质结界面与P N结界面产生偏离的原因 ,计算了外延生长参数对结偏离的影响 ,得到了对于C、Mg及Zn作为P型掺杂剂时 ,使得结偏位为 0时所需生长的GaAsspace层厚度 ,它们分别为 1~ 1.5nm、3~ 4nm及 12~ 15nm。计算与器件研制结果基本相符。
【Abstract】 The reasons of deviation of base-emitter P-N junction relative to the AlGaAs/GaAs heterojunction in LP-MOVPE growth of AlGaAs/GaAs HBT were analyzed. The effect of growth parameters on the deviation was calculated. The optimum thicknesses of space layer were 1.0~1.5 nm, 3.0~4.0 nm and 13~15 nm for C, Mg and Zn dopant, respectively. The values calculated were in agreement with the results from the devices.
- 【文献出处】 固体电子学研究与进展 ,Research & Progress of Solid State Electronics , 编辑部邮箱 ,2004年04期
- 【分类号】TN322.8
- 【被引频次】2
- 【下载频次】104