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SPM光纤连接器端面几何参数干涉测量仪
Sinusoidal Phase Modulating Interferometer for Measuring Geometric Parameters of Optical Fiber Connector Endface
【摘要】 分析了光纤连接器端面几何参数对光纤连接器性能的影响,提出了一种利用正弦相位调制(SPM)干涉仪测量光纤连接器端面几何参数的新方法。计算机模拟计算表明,这种方法能在有噪声干扰情况下高精度测量光纤连接器端面几何参数。
【Abstract】 Effects of geometric parameters of fiber connector endface on the performance of optical fiber connector were analyzed.A new method was proposed to measure geometric parameters of optical fiber connector endface.The geometric parameters are obtained by means of the sinusoidal phase modulating(SPM) interferometry.The computer simulations show clearly that the method can be used to measure geometric parameters of optical fiber connector endface with a high accuracy in noisy circumstances.
【关键词】 光学测量;
干涉仪;
正弦相位调制(SPM);
光纤连接器;
【Key words】 optical measurement; interferometer; sinusoidal phase modulation(SPM); optical fiber connector;
【Key words】 optical measurement; interferometer; sinusoidal phase modulation(SPM); optical fiber connector;
【基金】 上海市科技发展基金资助项目(011461060)
- 【文献出处】 光电子·激光 ,Journal of Optoelectronics.laser , 编辑部邮箱 ,2004年06期
- 【分类号】TH744.3
- 【被引频次】2
- 【下载频次】83