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Sb掺杂SnO2/SiO2纳米光学气敏薄膜的制备及其性质

Characteristics and Preparation of Nanometer-sized Sb-doped SnO2/SiO2Optical Gas-sensing Thin Films

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【作者】 顾铮先梁培辉张伟清

【Author】 GU Zheng-xian~(1**), LIANG Pei-hui~2, ZHANG Wei-qing~2(1.Laboratory of Photo-electric Functional Films,College of Sceince,University of Shanghai for Science and Technology,Shanghai 200093,China,Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Shanghai 201800,China)

【机构】 上海理工大学理学院光电功能薄膜实验室中国科学院上海光学精密机械研究所中国科学院上海光学精密机械研究所 上海200093上海201800上海201800

【摘要】 采用溶胶 凝胶(sol gel)工艺制备了Sb掺杂SnO2/SiO2复合膜。通过X射线衍射(XRD)、傅立叶变换红外谱(FT IR)及原子力显微镜(AFM)表征了薄膜样品的物相结构与表面形貌,利用紫外 可见光谱研究了复合薄膜光学特性,利用p 偏振光双面反射法对薄膜的气敏特性进行了测试。实验结果表明,薄膜中的晶粒具有纳米尺寸(~35nm)的大小,比表面积大,孔隙率高;薄膜的透光率高,可见光波段近95%;纳米Sb:SnO2/SiO2复合膜的气敏灵敏度高于纯SnO2薄膜及Sb掺杂的SnO2薄膜。

【Abstract】 Sb-doped SnO2/SiO2 nano-composition thin films were prepared by sol-gel method.The crystal structure and surface topograph of the thin films were characterized by X-ray diffraction(XRD),Fourier transform infrared spectroscopy(FT-IR) and atomic force microscopy(AFM).The optical properties of the thin films were studied by UV-VIS spectra.The gas-sensing property was tested by p-polarized reflectance.The experimental results show that,the crystalline grain size is about 34 nm,the specific surface area is large,and the duty porosity is high;the optical transmissivity is higher,near 95 % in visible spectrum range.Further,the gas sensitivity of Sb:SnO2/SiO2 nano-composition thin films is higher than one of Sb:SnO2 thin films.

【基金】 上海市教委曙光计划资助项目(02SG32);上海市教委发展基金资助项目(01F01)
  • 【文献出处】 光电子·激光 ,Journal of Optoelectronics.laser , 编辑部邮箱 ,2004年04期
  • 【分类号】O484.5;TN304.92
  • 【被引频次】3
  • 【下载频次】197
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