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金属纳米颗粒-聚电解质多层膜的X射线反射率研究
X-ray Reflectivity Studies on Metal Nanoparticle/Polyelectrolyte Multilayers
【摘要】 用静电自组装技术制备了不同层数的 Au纳米颗粒 -聚电解质多层膜 ,用 X射线反射及原子力显微镜对膜的微结构进行了表征 .研究发现 ,当 Au纳米颗粒下面的聚电解质层较薄时 ,膜中无清晰的界面结构 ;随着 Au纳米颗粒下面的聚电解质层的增厚 ,金属 -聚电解质多层膜的界面变得越来越清晰
【Abstract】 Electrostatic self-assembly technique was used to prepare Au-nanoparticle/polyelectrolyte multilayers. The microstructures of the films were characterized by X-ray reflectivity and the atomic force microscopy. It is found that when the polyelectrolyte layers under the Au nanoparticles were thin, there were no clear interfaces in the films; when the polyelectrolyte layers got thick, the interfaces become clear. Therefore, it needs to increase properly the thickness of the polyelectrolyte layers in order to get the metal nanoparticle/polyelectrolyte multilayers with clear interfaces.
【Key words】 Electrostatic self-assembly; Polyelectrolyte; Multilayer films; Interfaces; X-ray reflectivity;
- 【文献出处】 高等学校化学学报 ,Chemical Research In Chinese Universities , 编辑部邮箱 ,2004年07期
- 【分类号】O631
- 【被引频次】10
- 【下载频次】215