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氧化膜形貌对铝电解电容器寿命的影响

Influence of Oxide Film Surface Appearance on Capacitor Load Life

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【作者】 朱绪飞宋晔魏纯香顾义明陈卫东

【Author】 ZHU Xu-fei1 , SONG Ye1, WEI Chun-xiang1, GU Yi-ming2, CHEN Wei-dong2 (1. Chemical-engineering Institute,Nanjing University of Science & Technology, Nanjing 210014, China; 2. Nantong Hicon Electronics Co.LTD., Nantong 226361, China)

【机构】 南京理工大学化工学院南通海立电子有限公司南通海立电子有限公司 江苏南京210014江苏南京210014江苏南通226361江苏南通226361

【摘要】 对三种高压阳极化成铝箔进行了SEM的形貌和EDS组分分析,用三种铝箔分别制成400 V,6 800 霧电容器并进行了耐久性试验对比,对电容器性能和阳极化成铝箔氧化膜形貌之间的关系进行了探讨。结果表明:隧道腐蚀铝箔的氧化膜残存的杂质离子多,容易击穿;氧化膜表面过多的羟基对电容器的漏电流影响很大。

【Abstract】 Three kinds of formed aluminum foil were analyzed by SEM and EDS.Capacitors of 400V,6800μF were manufactured using these alumium foil and the durability experiments were carried out.The connection of electric properties of the capacitors and the configuration of oxide film of aluminum foil were discussed.The results show that the impurity ions remained in the tunnel of etched aluminum foil lead to the puncture easily. Overabundance hydroxyl group on the surface of oxide film have effect on the leakage current of capacitiors.

  • 【文献出处】 电子元件与材料 ,Electronic Components $ Materials , 编辑部邮箱 ,2004年08期
  • 【分类号】TM535
  • 【被引频次】5
  • 【下载频次】231
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