节点文献
一种用于标准单元版图交替移相掩模相位兼容性规则检查的工具
A Phase-Compatibility Rule Checker for Standard Cell Layout Designed with Alternating PSM
【摘要】 介绍了一套基于相位冲突图的生成和处理的新方法 ,可以准确、全面地对由传统方法设计的标准单元版图(暗场 )进行检查 .基于此方法的软件工具能够检查标准单元版图 ,找出不符合交替移相掩模设计要求的图形 ,并给出相关的修改建议 .实验结果证实了该工具的有效性
【Abstract】 Based on generation and processing of phase conflict graph,a new method is presented to fully and accurately verify the phase compatibility of dark field standard cell layouts,which are produced according to conventional design rules.A software implementing this method is presented as well,which has the capabilities of verifying standard cell layout,locating features with phase conflicts and giving out suggestions for modification.Experiment results show the effectiveness of this useful tool.
【关键词】 交替移相掩模;
相位冲突图;
标准单元;
【Key words】 alternating phase shifting mask; conflict graph; standard cell;
【Key words】 alternating phase shifting mask; conflict graph; standard cell;
【基金】 国家自然科学基金 (批准号 :60 1760 15 ;90 2 0 70 0 2 );国家高技术研究发展计划 (批准号 :2 0 0 2AA1Z14 60 )资助项目~~
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2004年05期
- 【分类号】TN305.7
- 【被引频次】7
- 【下载频次】46