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集成铁电器件中的关键工艺研究
Study on the Key Processes of Integrated Ferroelectric Device
【摘要】 对集成铁电器件中的关键工艺进行了研究,采用改进的溶胶—凝胶(Sol-Gel)法制备了高品质、(110)择优取向的锆钛酸铅(PZT)铁电薄膜,成功的利用离子束刻蚀(IBE)、反应离子刻蚀(RIE)和湿法腐蚀方法对PZT薄膜进行了刻蚀加工,采用正胶剥离和干法刻蚀工艺实现了金属铂(Pt)电极图形,为集成铁电器件的实现提供了良好的工艺基础。
【Abstract】 Key processes of integrated ferroelectric devices based on silicon have been studied. High quality and(110) preferential oriented ferroelectric thin films, lead zirconate titanate (PZT), have been prepared using animproved sol-gel method. PZT thin films have been successfully patterned by ion beam etching (IBE), reactiveion etching (RIE) and wet etching. The platinum electrodes have been well patterned by lift-off process and dryetching techniques.
【关键词】 铁电薄膜;
锆钛酸铅;
溶胶—凝胶;
刻蚀;
剥离;
【Key words】 Ferroelectric thin film; PZT; Sol-gel; Etching; Lift-off;
【Key words】 Ferroelectric thin film; PZT; Sol-gel; Etching; Lift-off;
【基金】 国家“863”(2002AA404500)资助;“973”(G1999033105)资助
- 【文献出处】 仪器仪表学报 ,Chinese Journal of Scientific Instrument , 编辑部邮箱 ,2003年S2期
- 【分类号】TN384
- 【被引频次】2
- 【下载频次】155