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改善(Pb,Ca)TiO3薄膜的铁电性能研究
Ferroelectric Properties Improvement of (Pb,Ca)TiO3 Thin Films on Si Substrates Using LaNiO3 as Bottom Electrodes
【摘要】 用溶胶-凝胶法和快速退火工艺在LaNiO3/Si(111)基片制备出高度(100)取向生长的钙钛矿相(Pb0.76Ca0.24)TiO3(PCT)薄膜。用原子力显微镜分析了薄膜的表面形貌;测试了薄膜的铁电和介电特性。PCT薄膜的剩余极化强度和矫顽场分别为9.3μC/cm2和64kV/cm,在100kHz薄膜的介电系数和损耗分别为231和0.045。比较了在不同电极制备PCT薄膜的结果,用LaNiO3作底电极,改善了铁电性,降低了矫顽场。
【Abstract】 Ferroelectric (Pb076Ca024)TiO3 (PCT) thin films were grown on LaNiO3 (LNO) coated Si(111) substrates by using a SolGel process The highly (100)oriented PCT films on LNO coated Si(111) substrates have been obtained Atomic force microscopy (AFM) revealed that the surface morphology smooth The PCT thin films on LNO coated Si(111) substrates annealed at 600 °C have the remanent polarization (Pr) and coercive electric field (Ec) values were 93 μC/cm2 and 64 kV/cm, respectively At 100 kHz, the dielectric content and dielectric loss of the PCT films on LNO coated Si(111) substrate was 231 and 0045, respectively Compare with Pt/Ti/SiO2/Si substrates, we can find that used LNO as bottom electrode, the ferroelectric properties have been improved
【Key words】 PCT thin films; LaNiO3 electrode; orientation; electrical properties; Sol-Gel;
- 【文献出处】 压电与声光 ,Piezoelectrics & Acoustooptics , 编辑部邮箱 ,2003年03期
- 【分类号】O484.42
- 【下载频次】74