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扫描探针显微学中的云纹方法
Moiré fringes of HOPG and mica in scanning probe microscopy
【摘要】 在扫描探针显微镜 (SPM)的扫描过程中 ,由SPM的扫描线与物质表面周期性晶格结构进行干涉可以形成纳米云纹图像 .采用高取向热解石墨 (HOPG)和云母作为试件 ,分别对扫描隧道显微镜 (STM)和原子力显微镜 (AFM)云纹进行了研究 ,实验结果与理论分析完全一致 .SPM纳米云纹法在纳米测量和表征方面具有较大的应用前景 .
【Abstract】 A Moiré technique using a scanning probe microscope (SPM) is developed, in whic h the natural periodic structure of a crystal is used as an ideal spacing gratin g. Formation principle of the SPM moiré fringes is discussed. Moiré patterns f ormed on highly oriented pyrolytic graphite (HOPG) and mica are investigated exp erimentally with STM and AFM, respectively. The results demonstrate the feasibil ity of the SPM Moiré technique in studying deformation and defects of crystals at the nanometer scale.
【关键词】 云纹;
SPM;
晶格栅线;
纳米测量;
【Key words】 Moiré fringe; SPM; crystalline lattice; nanometer-scale characterization;
【Key words】 Moiré fringe; SPM; crystalline lattice; nanometer-scale characterization;
【基金】 国家自然科学基金重大项目 (批准号 :90 2 0 6 0 2 8;6 0 0 710 0 9)资助的课题~~
- 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2003年10期
- 【分类号】O348.11
- 【被引频次】8
- 【下载频次】182