【摘要】 给出了一种新的微波集成电路成品率优化算法———基于非参数统计的成品率快速优化算法。利用该方法 ,仅需要较少的仿真次数或直接利用非参数统计成品率分析算法的结果 ,便可直接得出一组或几组参数的成品率优化值 ,有效地缩短了优化时间。算例表明 ,该方法对微波集成电路进行快速成品率优化设计及提高电路设计的稳定性具有较好的应用价值更多还原

【Abstract】 A new method of yield optimization based on non parametric statistics is introd uced. With the new method, we can obtain the result either by a few simulations, or by the result of yield analysis based on non parametric statistics. It impr oves efficiency of yield optimization. The test example shows that this method h as much practical value in yield optimization design and electronic circuit desi gn.更多还原