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用双视场电子散斑干涉实现检测表面的变尺度同时测量

Simultaneous Measurement of Deformations for Macro and Micro Surface Areas by Using Double-Field-of-View Electronic Speckle pattern Interferometry

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【作者】 邓兵李喜德施惠基胡小方

【Author】 DENG Bing~1, LI Xi-de~1, SHI Hui-ji~1, HU Xiao-fang~2(1.Tsinghua University, Beijing 100084; 2.University of Science Technology of China, Hefei 230027)

【机构】 清华大学工程力学系中国科学技术大学力学和机械工程系 北京100084北京100084合肥230027

【摘要】 结构或材料中所含的微小缺陷对其宏观力学性能具有重要的影响,探讨这些微小缺陷引起的微变形及其在结构整体变形中所占的份额,对于有效地评估结构和材料的整体性能及局部演化过程都具有重要的理论和工程价值.本文应用双视场电子散斑干涉技术,实现了对被测对象表面的全场变形和局部微观场变形的同时实时检测.给出了宏观及局部位移场分布,并结合有限元数值分析与实验结果进行了比较.

【Abstract】 Micro defects or cracks in the material or a structure have an important effect on its macro-scale mechanical property. So it is valuable to evaluate the entire property of the material by investigating the effects of the defects and the deformation fluctuations in macro deformations. The double-field-of-view ESPI system has been presented in this paper and employed to measure the macro-scale and micro-scale deformations of the tested object simultaneously. The entire and local displacements were given, and the experimental results were compared with the FEM calculated results.

【基金】 国家自然科学基金资助项目10072031;10232030;国家重点基础研究专项经费G1999065002的资助
  • 【文献出处】 实验力学 ,Journal of Experimental Mechanics , 编辑部邮箱 ,2003年04期
  • 【分类号】TB30
  • 【被引频次】2
  • 【下载频次】122
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