【摘要】 分析了均匀性度量应满足的基本条件 ,根据物理学的势和力的模型 ,提出了均匀性度量的势函数模型 ,该模型较好地解决了均匀性度量的可计算性、布点的均匀性调整方法等问题 ;而且具有均匀性度量所应该具有的所有优良性质 ,如旋转对称性、平移对称性、中心对称性等 .最后给出了应用实例 ,并就低维投影的均匀性问题和势函数模型的改进作了讨论更多还原

【Abstract】 The basic characteristics that any criterion of uniformity measurement should have are discussed. According to the model of physics potential and force, a new criterion of uniformity measurement, potential function model of uniformity measurement, is proposed. The model not only can solve the problems such as computability and the adjustable character for uniformity, but also has all the good characters, which a uniformity measurement should have, such as rotation symmetry, translation symmetry and center reflection symmetry. An example is shown and the uniformity of lower dimension projection is discussed at the end.更多还原