节点文献
HgI2探测器中晶体表面处理的研究
Investigation of Surface Treating Methods of HgI2 Crystals in a Nuclear Detector
【摘要】 该文研究了HgI2晶体表面状况对晶体电学性质的影响,主要探讨在不同的腐蚀条件下KI溶液腐蚀HgI2晶体时,得到不同的表面状况,从而对HgI2晶体电学性质产生的影响.扫描电镜(SEM)、X射线光电子能谱(XPS)及微电流计分析表明,通过化学腐蚀,在0℃时,用浓度为10%~20%KI溶液,腐蚀时间2min左右,可以得到较好的晶体表面状况.上述工艺条件,能够很大程度上优化HgI2晶体的电学参数,从而提高HgI2核探测器的性能.
【Abstract】 This paper studies the effects of surface conditions of HgI2 crystal on the electrical properties of the crystal. The investigation focuses the attention on KI solution corroding the surface of HgI2 crystal in different corrosion and on the effects of that. The tests and analysis by use of SEM (scan electrical microscope) and XPS show that the surface condition of HgI2 crystal can be improved when the temperature of KI solution is approximately 0 ℃, the concentration is 10%~20%, and the corrosion period is around 2 minutes. The technical process for treating surface of HgI2 crystals described above can optimize the electrical performance of HgI2 crystals, and thereby enhance the performance of HgI2 nuclear detector.
【Key words】 nuclear detector; HgI2 crystal; surface treatment; drain current;
- 【文献出处】 上海大学学报(自然科学版) ,Journal of Shanghai University(Natural Science Edition) , 编辑部邮箱 ,2003年02期
- 【分类号】TN389
- 【被引频次】5
- 【下载频次】82