【摘要】 利用原子力显微镜探讨了表面电荷及分子端基对分子沉积膜纳米摩擦特性的影响,并考察了表面形貌在不同扫描方向和法向高度上对摩擦力的影响.结果表明:对Si3N4针尖而言,表面净电荷对摩擦特性有一定的影响,不同类型的表面电荷对摩擦力和摩擦系数的影响不同,正电荷影响相对较大;在较小载荷和粘附力的条件下,针尖在表面上滑动时所受的摩擦作用同分子端基有关;单层CuTsPc分子沉积膜表面形貌的取向对摩擦力影响不大,分子沉积膜的表面高度同摩擦力,即时测量值并不存在对应关系,摩擦力受表面形貌的影响较小.更多还原

【Abstract】 The effects of the exposed terminal groups and surface charges on the nanofrictional properties of molecular deposition films on single crystal silicon substrate were analyzed on an atomic force microscope. At the same time, the effect of the surface morphologies of copper phthalocyaninetetrasulfonic acidic tetrasodium salt (CuTsPc) molecular deposition monolayer on the frictional force in different scan and normal directions was also investigated. The results showed that the friction was related to the surface net charge on Si3N4 tip to some extent, and the surface positive charges had a larger effect on the nanofriction behavior of the MD film. The friction was dependent on the exposed terminal groups under a relatively smaller load when the AFM tip slid on the film surface. Moreover, the surface topography of the MD film had no significant effect on the nanoscale frictional force of the MD film, and the measured nanofriction force was related to the local surface slope of the MD film but not the surface morphology height distribution.更多还原