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离子交换树脂预富集与分光光度法联用测定高纯稀土中的痕量硅
STUDY ON THE DETERMINATION OF TRACE SI IN HIGH PURITY RARE EARTH BY ION EXCHANGE RESIN PRECONCENTRATION AND SPECTROPHOTOMETRY
【摘要】 在强酸性条件下,以薄层树脂相吸光光度法测定硅的新方法,本法灵敏度高(810=7.3×105L/molcm),比水相光度法提高16倍。精密度理想 (测定6.0g Si 6次,RSD=1.2%)。测定了高纯稀土中硅,线性范围0g/25ml~16g/25ml,检出限1.2g/L,回收率96%~101%。
【Abstract】 A new method to determine Si by thin layer resin phase spectrophotometry in high acidic condition has been developed. The method has a high sensitivity (810=7.3?05L/mol穋m), which is 16 times higher than that of liquid phase spectrophotometry. It has an ideal precision(6.0g Si, n=6,RSD=1.2%). Si in high purity rare earth has been determined, the linear range, detection limit and recovery are 0g/25ml~16g/25ml, 1.2g/L and 96%~101%, respectively.
- 【文献出处】 离子交换与吸附 ,Ion Exchange and Adsorption , 编辑部邮箱 ,2003年04期
- 【分类号】O657.3
- 【被引频次】9
- 【下载频次】108