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离子交换树脂预富集与分光光度法联用测定高纯稀土中的痕量硅

STUDY ON THE DETERMINATION OF TRACE SI IN HIGH PURITY RARE EARTH BY ION EXCHANGE RESIN PRECONCENTRATION AND SPECTROPHOTOMETRY

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【作者】 闫永胜黄卫红陆晓华

【Author】 YAN Yongsheng HUANG Weihong LU Xiaohua Department of Environmental Science and Engineering of Huazhong University of Science and Technology, Wuhan 30074, China

【机构】 华中科技大学环境科学与工程学院华中科技大学环境科学与工程学院 武汉430074武汉430074武汉430074

【摘要】 在强酸性条件下,以薄层树脂相吸光光度法测定硅的新方法,本法灵敏度高(810=7.3×105L/molcm),比水相光度法提高16倍。精密度理想 (测定6.0g Si 6次,RSD=1.2%)。测定了高纯稀土中硅,线性范围0g/25ml~16g/25ml,检出限1.2g/L,回收率96%~101%。

【Abstract】 A new method to determine Si by thin layer resin phase spectrophotometry in high acidic condition has been developed. The method has a high sensitivity (810=7.3?05L/mol穋m), which is 16 times higher than that of liquid phase spectrophotometry. It has an ideal precision(6.0g Si, n=6,RSD=1.2%). Si in high purity rare earth has been determined, the linear range, detection limit and recovery are 0g/25ml~16g/25ml, 1.2g/L and 96%~101%, respectively.

【关键词】 离子交换树脂预富集分光光度法稀土
【Key words】 Ion exchange resinPreconcentrationRare earthSi.
  • 【文献出处】 离子交换与吸附 ,Ion Exchange and Adsorption , 编辑部邮箱 ,2003年04期
  • 【分类号】O657.3
  • 【被引频次】9
  • 【下载频次】108
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