【摘要】 材料的S—N、ε—N及da dN—ΔK疲劳性能数据分别是应力寿命法、局部应变法以及LEFM裂纹扩展法进行结构寿命分析的基础。文中根据几种疲劳寿命模型 ,探讨同一材料三种疲劳性能数据之间的内在联系及相互预测的可能性。具体内容包括 ,( 1)用da dN—ΔK性能数据预测S—N数据。 ( 2 )用ε—N性能数据预测S—N数据。 ( 3 )用ε-N性能数据推测da dN—ΔK数据。研究结果表明 ,同种材料的S—N、ε—N及da dN—ΔK疲劳性能数据之间是相互联系的 ,存在相互预测的可能性。更多还原

【Abstract】 The S—N, ε—N and da/dN—ΔK curves are three basic fatigue property data of materials and they are respectively used in stress-life method, local strain method and LEFM crack propagation method to predicate fatigue life of structures. Researchers in the word have to spend much money and time to obtain these data through experiments. And to certain material, three types of experiments usually need to be done to obtain these data. This paper discusses the internal relations and the probability of forecasting each other among these fatigue data, which includes: (1) forecasting the S—N curve by da/dN—ΔK curve of materials;(2) forecasting the S—N curve by ε—N curve of materials;(3) forecasting da/dN—ΔK curve by ε—N curve of materials. The results show that it exists probability of forecasting each other among three data.更多还原