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Stress analysis of electrostrictive material with an elliptic defect

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【作者】 蒋泉匡震邦

【Author】 Jiang Quan & Kuang ZhenbangDepartment of Engineering Mechanics, Shanghai Jiaotong University, Shanghai 200240, China Correspondence should be addressed to Kuang Zhenbang (email:zbkuang@mail.sjtu.edu.cn)

【机构】 Department of Engineering MechanicsShanghai Jiaotong UniversityShanghai 200240ChinaChina

【摘要】 <正> It is shown that the constitutive equation and electric body force used to discuss the stress analysis of electrostrictive material in some previous literature are not appropriate. This paper presents the corrected stress solution for the infinite plane with an insulated elliptic hole under an applied electrical field. The numerical result obtained for the PMN material constants show that the stress near the end of the narrow elliptic hole is the tensile stress.

【Abstract】 It is shown that the constitutive equation and electric body force used to discuss the stress analysis of electrostrictive material in some previous literature are not appropriate. This paper presents the corrected stress solution for the infinite plane with an insulated elliptic hole under an applied electrical field. The numerical result obtained for the PMN material constants show that the stress near the end of the narrow elliptic hole is the tensile stress.

【基金】 This work was supported by the National Natural Science Foundation of China (Grant Nos.10132010 and 10072033).
  • 【文献出处】 Science in China(Series G) ,中国科学(G辑:物理学)(英文版) , 编辑部邮箱 ,2003年05期
  • 【分类号】TM27
  • 【被引频次】4
  • 【下载频次】29
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