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像散法对微位移和微振动的实时测量

An Astigmatic Method for Real-time Nanometer Vibration Measurement

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【作者】 贺锋涛白永林冯晓强侯洵

【Author】 He Fengtao 1,2 , Bai Yonglin 1,2 , Feng Xiaoqiang 1,2 , Hou Xun 1 1 State Key Laboratory of Transient Optics and Technology, Xi′an Institute of Optics and Precision Mechanics, Xi′an, China, 710068 2 Graduate School of the Chinese Academy of Sciences,Beijing 100039

【机构】 中科院西安光学精密机械研究所瞬态光学技术国家重点试验室中科院西安光学精密机械研究所瞬态光学技术国家重点试验室 西安710068中国科学院研究生院北京100039西安710068

【摘要】 提出了一种通过对光学像散量的检测来实现对物体的微位移和微振动进行实时非接触测量的新方法 该方法采用四象限光电探测器测量由于物体相对于光学系统焦点的偏离而引起的像散量 ,参照已标定的物体位置与像散量之间的关系 ,可计算出物体的实际位移或振幅 利用这套系统对压电陶瓷片的振动状态进行了测量 ,得到了振动的振幅及频率 测量结果表明 ,该系统的测量灵敏度优于 17nm

【Abstract】 A simple, compact and non-contact astigmatic method for real-time nanometer displacement and vibration measurement is presented. A quadrant detector measures the astigmation caused by the deviation of the target to the focus point, and the focus error signal, composed of the outputs of the quadrant detector, indicates the amount of the deviation. Referenced to the calibrated linear correlations between the deviation and the focus error signal, the deviation or the amplitude of vibration can be obtained. The measurement system is setup and the vibration of a piezoelectric ceramic slice that excited by the low AC voltage is measured. The results show that the system can recognize the displacement less than 17 nm.

  • 【文献出处】 光子学报 ,Acta Photonica Sinica , 编辑部邮箱 ,2003年10期
  • 【分类号】TH822
  • 【被引频次】27
  • 【下载频次】388
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